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ZrN nucleation layer provides backside ohmic contact to MBE-grown GaN nanowires

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F25%3A00618619" target="_blank" >RIV/67985882:_____/25:00618619 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1039/D5NR00321K" target="_blank" >https://doi.org/10.1039/D5NR00321K</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1039/d5nr00321k" target="_blank" >10.1039/d5nr00321k</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    ZrN nucleation layer provides backside ohmic contact to MBE-grown GaN nanowires

  • Original language description

    Self-assembled GaN nanowires are typically grown on Si substrates with convenient nucleation layers. Light-emitting devices based on arrays of GaN nanowires require that the nucleation layer is electrically conductive and optically nontransparent to prevent the absorption of generated light in the Si substrate. This study reports the molecular beam epitaxial growth of GaN nanowires on ZrN nucleation layers sputtered on sapphire and demonstrates that ZrN provides ohmic contact to dense vertical arrays of n-type GaN nanowires. The ohmic nature of the ZrN/n-type GaN nanowire contact is evidenced by the measurement of the current-voltage characteristics of individual as-grown nanowires using nanomanipulators in a scanning electron microscope. The limitations and advantages of single-nanowire measurements are discussed, and approaches to overcome these limitations are proposed. The feasibility of this concept is demonstrated by the measurement of single nanowires with a p-n junction, exhibiting highly rectifying characteristics

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    <a href="/en/project/GF23-07585K" target="_blank" >GF23-07585K: Heterostructures of ZnO/(Al,Ga)N Nanowires for Optoelectronics</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2025

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Nanoscale

  • ISSN

    2040-3364

  • e-ISSN

    2040-3372

  • Volume of the periodical

    17

  • Issue of the periodical within the volume

    13

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    7

  • Pages from-to

    8111-8117

  • UT code for WoS article

    001436835300001

  • EID of the result in the Scopus database

    2-s2.0-105001829594