ZrN nucleation layer provides backside ohmic contact to MBE-grown GaN nanowires
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F25%3A00618619" target="_blank" >RIV/67985882:_____/25:00618619 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1039/D5NR00321K" target="_blank" >https://doi.org/10.1039/D5NR00321K</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1039/d5nr00321k" target="_blank" >10.1039/d5nr00321k</a>
Alternative languages
Result language
angličtina
Original language name
ZrN nucleation layer provides backside ohmic contact to MBE-grown GaN nanowires
Original language description
Self-assembled GaN nanowires are typically grown on Si substrates with convenient nucleation layers. Light-emitting devices based on arrays of GaN nanowires require that the nucleation layer is electrically conductive and optically nontransparent to prevent the absorption of generated light in the Si substrate. This study reports the molecular beam epitaxial growth of GaN nanowires on ZrN nucleation layers sputtered on sapphire and demonstrates that ZrN provides ohmic contact to dense vertical arrays of n-type GaN nanowires. The ohmic nature of the ZrN/n-type GaN nanowire contact is evidenced by the measurement of the current-voltage characteristics of individual as-grown nanowires using nanomanipulators in a scanning electron microscope. The limitations and advantages of single-nanowire measurements are discussed, and approaches to overcome these limitations are proposed. The feasibility of this concept is demonstrated by the measurement of single nanowires with a p-n junction, exhibiting highly rectifying characteristics
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
<a href="/en/project/GF23-07585K" target="_blank" >GF23-07585K: Heterostructures of ZnO/(Al,Ga)N Nanowires for Optoelectronics</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2025
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Nanoscale
ISSN
2040-3364
e-ISSN
2040-3372
Volume of the periodical
17
Issue of the periodical within the volume
13
Country of publishing house
GB - UNITED KINGDOM
Number of pages
7
Pages from-to
8111-8117
UT code for WoS article
001436835300001
EID of the result in the Scopus database
2-s2.0-105001829594