Ultrahigh vacuum scanning low energy electron microscope (UHV SLEEM) for surface studies.

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F02%3A12020037" target="_blank" >RIV/68081731:_____/02:12020037 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Ultrahigh vacuum scanning low energy electron microscope (UHV SLEEM) for surface studies.
Original language description
The aim of project is to study clean and well-defined surfaces via interaction of electrons at energies from 0 to 25 keV with a high spatial resolution. During the period 1995-2001 we have built an Ultrahigh Vacuum Scanning Low Energy Electron Microscopefor surface studies. The image resolution below 50 nm can be achieved at 10 eV. The residual pressure in the specimen vicinity is 10.sup.-10./sup. mbar. The paper briefly describes main parameters of the instrument.
Czech name
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Czech description
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Project
<a href="/en/project/IAA1065901" target="_blank" >IAA1065901: Wave-optical contrasts in the scanning electron microscope</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 2nd annual meeting of the Czechoslovak microscopy society.
ISBN
80-238-8749-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
79-82
Publisher name
CSMS
Place of publication
Brno
Event location
Vranovská Ves [CZ]
Event date
Feb 8, 2002
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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