Electrostatic mini SLEEM for surface studies.

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F02%3A12020040" target="_blank" >RIV/68081731:_____/02:12020040 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Electrostatic mini SLEEM for surface studies.

Original language description

Exploitation of the low-energy electrons is advantageous for several reasons. One of them is their smaller penetration depth into the material, which reveals itself as favourable for the surface analysis. Using the low-energy electrons even causes partial, and in some cases total elimination ofcharging effects at non-conductive or slightly conductive specimens. Slowprimary electrons (PE) cause only reduced radiation damage of specimens.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2002

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Proceedings of the 2nd annual meeting of the Czechoslovak microscopy society.

ISBN

80-238-8749-1

ISSN

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e-ISSN

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Number of pages

2

Pages from-to

95-96

Publisher name

CSMS

Place of publication

Brno

Event location

Vranovská Ves [CZ]

Event date

Feb 8, 2002

Type of event by nationality

EUR - Evropská akce

UT code for WoS article

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