Scanning low energy electron microscopy.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F03%3A12030095" target="_blank" >RIV/68081731:_____/03:12030095 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Scanning low energy electron microscopy.
Original language description
Extensive review deals with principles of the scanning low energy electron microscopy in all important aspects starting from motivations to lower energy of electrons impinging on the specimen, including problems of interaction of slow electrons with thematter, emission yields, electron optical problems of formation low energy electron beams, detection issues, and general as well as specific questions of the instrumentation, and finishing with presentation of selected application results demonstrating capabilities of this microscopic mode.
Czech name
—
Czech description
—
Classification
Type
C - Chapter in a specialist book
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
—
Result continuities
Project
—
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Book/collection name
Advances in imaging and electron physics Vol. 128.
ISBN
—
Number of pages of the result
134
Pages from-to
309-443
Number of pages of the book
—
Publisher name
Elesevier Science
Place of publication
New York
UT code for WoS chapter
—