Conjugated Silicon?Based Polymer Resists for Nanotechnologies: EB and UV Meditated Degradation Processes in Polysilanes
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F10%3A00341918" target="_blank" >RIV/68081731:_____/10:00341918 - isvavai.cz</a>
Alternative codes found
RIV/70883521:28140/10:63509541
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Conjugated Silicon?Based Polymer Resists for Nanotechnologies: EB and UV Meditated Degradation Processes in Polysilanes
Original language description
The comparison of the susceptibility of aryl-substituted polysilanes to the photodegradation by electron beam (EB) and UV radiation is examined on the prototypical material, poly[methyl(phenyl)silylene] (PMPSi). The main purpose of this paper is to compare the photoluminescence (PL) and cathodoluminescence (CL) after major degradation, predominantly in the long wavelength range of 400?600 nm, studying the disorder due to dangling bonds, conformational transformations and weak bonds created by the degradation process. The UV degradation was a completely reversible process, whereas the EB degradation process was only reversible, provided certain material specific level of degradation was not exceeded. This observation supports different paths and final states in both UV and EB degradations. The results serve for the optimization of polysilane nanoresists.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/IAA100100622" target="_blank" >IAA100100622: CONJUGATED SILICON ? BASED POLYMER RESISTS FOR NANOTECHNOLOGIES</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Materials Transactions
ISSN
1345-9678
e-ISSN
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Volume of the periodical
51
Issue of the periodical within the volume
2
Country of publishing house
JP - JAPAN
Number of pages
5
Pages from-to
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UT code for WoS article
000276538900001
EID of the result in the Scopus database
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