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Conjugated Silicon?Based Polymer Resists for Nanotechnologies: EB and UV Meditated Degradation Processes in Polysilanes

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F10%3A00341918" target="_blank" >RIV/68081731:_____/10:00341918 - isvavai.cz</a>

  • Alternative codes found

    RIV/70883521:28140/10:63509541

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Conjugated Silicon?Based Polymer Resists for Nanotechnologies: EB and UV Meditated Degradation Processes in Polysilanes

  • Original language description

    The comparison of the susceptibility of aryl-substituted polysilanes to the photodegradation by electron beam (EB) and UV radiation is examined on the prototypical material, poly[methyl(phenyl)silylene] (PMPSi). The main purpose of this paper is to compare the photoluminescence (PL) and cathodoluminescence (CL) after major degradation, predominantly in the long wavelength range of 400?600 nm, studying the disorder due to dangling bonds, conformational transformations and weak bonds created by the degradation process. The UV degradation was a completely reversible process, whereas the EB degradation process was only reversible, provided certain material specific level of degradation was not exceeded. This observation supports different paths and final states in both UV and EB degradations. The results serve for the optimization of polysilane nanoresists.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/IAA100100622" target="_blank" >IAA100100622: CONJUGATED SILICON ? BASED POLYMER RESISTS FOR NANOTECHNOLOGIES</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2010

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Materials Transactions

  • ISSN

    1345-9678

  • e-ISSN

  • Volume of the periodical

    51

  • Issue of the periodical within the volume

    2

  • Country of publishing house

    JP - JAPAN

  • Number of pages

    5

  • Pages from-to

  • UT code for WoS article

    000276538900001

  • EID of the result in the Scopus database