Electron optical properties of the cathode lens combined with a focusing magnetic/immersion-magnetic lens

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F10%3A00350659" target="_blank" >RIV/68081731:_____/10:00350659 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Electron optical properties of the cathode lens combined with a focusing magnetic/immersion-magnetic lens
Original language description
Cathode lens (CL) is an electron optical element commonly used in the photo-emission electron microscopy (PEEM), low energy electron microscopy (LEEM) and last but not least in the scanning electron microscopy (SEM). We have used the EOD software for calculation of aberration coefficients for the sequential and overlapped fields.
Czech name
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Czech description
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Project
<a href="/en/project/IAA100650902" target="_blank" >IAA100650902: Scanning transmission electron microscopy with very slow electrons</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
ISBN
978-80-254-6842-5
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
Institute of Scientific Instruments AS CR, v.v.i
Place of publication
Brno
Event location
Skalský dvůr
Event date
May 31, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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