Scanning transmission low-energy electron microscopy

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F11%3A00367292" target="_blank" >RIV/68081731:_____/11:00367292 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1147/JRD.2011.2156190" target="_blank" >http://dx.doi.org/10.1147/JRD.2011.2156190</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1147/JRD.2011.2156190" target="_blank" >10.1147/JRD.2011.2156190</a>

Result language
angličtina
Original language name
Scanning transmission low-energy electron microscopy
Original language description
We discuss an extension to the transmission mode of the cathode-lens-equipped scanning electron microscope, enabling operation down to the lowest energies of electrons. Penetration of electrons through free-standing ultrathin films is examined along thefull energy scale, and the contribution of the secondary electrons (SEs), released near the bottom surface of the sample, is shown, enhancing the apparent transmissivity of the sample to more than 100%. Provisional filtering off of the SEs, providing thedark-field signal of forward-scattered electrons, was made using an annular 3-D adjustable detector inserted below the sample. Demonstration experiments were performed on the graphene flakes and on a 3-nm-thick carbon film. Electron penetrability at thelowest energies was measured on the graphene sample.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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