Advances in atomic resolution secondary electron imaging
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F25%3A00618628" target="_blank" >RIV/68081731:_____/25:00618628 - isvavai.cz</a>
Result on the web
<a href="https://www.epjap.org/articles/epjap/full_html/2025/01/ap20240165/ap20240165.html" target="_blank" >https://www.epjap.org/articles/epjap/full_html/2025/01/ap20240165/ap20240165.html</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1051/epjap/2025007" target="_blank" >10.1051/epjap/2025007</a>
Alternative languages
Result language
angličtina
Original language name
Advances in atomic resolution secondary electron imaging
Original language description
We have developed an efficient detector of secondary electrons (SEs) for a high-performance scanning transmission electron microscope (STEM) and tested it on several materials. Using the detector at 60 keV, we resolved the nearest neighbor atoms separated by 0.142 nm in SE images of graphene, and detected single-atom substitutions in graphene and monolayer MoS2. We imaged single heavy atoms on an amorphous carbon thin film, and the surface structure of gold nanoparticles supported on a thin film as well as on a bulk substrate. Other application examples shown in this paper include SE imaging combined with 4D STEM, simultaneous SE and electron energy loss spectroscopy (EELS) imaging, and simultaneous imaging of entrance and exit sides of a sample using two separate SE detectors. The results point to an exciting future for atomic-resolution SE imaging.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
<a href="/en/project/GA21-13541S" target="_blank" >GA21-13541S: Quantitative low energy 4D-STEM imaging of beam sensitive samples</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2025
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
European Physical Journal-Applied Physics
ISSN
1286-0042
e-ISSN
1286-0050
Volume of the periodical
100
Issue of the periodical within the volume
20 March
Country of publishing house
FR - FRANCE
Number of pages
10
Pages from-to
9
UT code for WoS article
001448026800001
EID of the result in the Scopus database
2-s2.0-105001182196