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Beyond Imaging: Scanning Electron Microscope for the Quantitative Mass Measurement

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F13%3A00421778" target="_blank" >RIV/68081731:_____/13:00421778 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216305:26210/13:PU104935

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Beyond Imaging: Scanning Electron Microscope for the Quantitative Mass Measurement

  • Original language description

    Quantitative measurements of thin samples, e.g., mass determination of macromolecular assemblies, have been performed for many years by the dedicated scanning transmission electron microscopes (STEM) established at only a few institutions worldwide [1,2]. We show that such quantitative measurements can also be performed by commercial high-resolution scanning electron microscopes (SEM) if they are appropriately extended. This includes mainly a very sensitive and well calibrated annular dark-field (ADF) detector, a specific data processing enabling to obtain simultaneously structural information and data on the mass thickness distribution, and a specific cryo-preparation of investigated samples.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BH - Optics, masers and lasers

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2013

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microscopy and Microanalysis

  • ISSN

    1431-9276

  • e-ISSN

  • Volume of the periodical

    19

  • Issue of the periodical within the volume

    S2

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    2

  • Pages from-to

    130-131

  • UT code for WoS article

  • EID of the result in the Scopus database