Mass measurements using electron scattering employing an "in-lens" scanning electron microscope

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F12%3A00387268" target="_blank" >RIV/68081731:_____/12:00387268 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Mass measurements using electron scattering employing an "in-lens" scanning electron microscope
Original language description
Annular dark-field scanning transmission electron microscopy (ADF STEM) at lower electron energies recently became important for direct imaging of samples consisting of elements with lower atomic numbers without the need of any additional contrast enhancement like staining by heavy atoms. Furthermore, the ADF STEM offers the opportunity for quantitative studies such as mass measurements of organic (biological and non-bilological) and inorganic specimens at the nanoscale. Here, we present the hardware and software extensions of a commercial high resolution scanning electron microscope (SEM) for the above manitoned applications.
Czech name
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Czech description
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Project
<a href="/en/project/EE.2.3.20.0103" target="_blank" >EE.2.3.20.0103: Support for human resources and transfer of knowledge in conditions of international cooperation of research teams</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
EMC 2012. Proceedings of the 15th European Microscopy Congress
ISBN
978-0-9502463-6-9
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
111-112
Publisher name
The Royal Microscopical Society
Place of publication
Manchester
Event location
Manchester
Event date
Sep 16, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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