Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00436622" target="_blank" >RIV/68081731:_____/14:00436622 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26210/14:PU110188
Result on the web
<a href="http://dx.doi.org/10.1017/S1431927614008083" target="_blank" >http://dx.doi.org/10.1017/S1431927614008083</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1017/S1431927614008083" target="_blank" >10.1017/S1431927614008083</a>

Result language
angličtina
Original language name
Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM
Original language description
The STEM (scanning transmission electron microscope) is useful device combining features of scanning and transmission electron microscopes. The sample in form of ultrathin section is scanned by the electron probe and the transmitted electrons are detected. Except the dedicated STEMs this mode can exist as options in both TEM and SEM. The STEM based on the SEM equipped by a transmission detector (often called as low voltage STEM) was used for presented experiments. Nowadays, the low voltage STEM is moreoften used, and in many cases replaces the typical TEM. Here, we report investigations of embedding media that are typically used for TEM preparation of biological samples.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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