Using environmental scanning electron microscopy (ESEM) as a non-invasive method to studying fixed parasites

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00434114" target="_blank" >RIV/68081731:_____/14:00434114 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Using environmental scanning electron microscopy (ESEM) as a non-invasive method to studying fixed parasites
Original language description
Scanning electron microscopy (SEM) is popular and for taxonomy of parasites very important and not substituted method in many times. However sometimes taxonomists have only one specimen and cannot use classical SEM, because their sample (poor conductor)have to be fixed, dehydrated and coated before it can be observed. This method condemns samples for destroying and do not allow other using of it, e.g. for molecular study or depositing as type material in museum. Moreover, the specimen preparation is often long and slow. Environmental scanning electron microscopy (ESEM) brings two main advantages: elimination of speed of sample preparation and non-invasivity.
Czech name
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Czech description
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Project
<a href="/en/project/GA14-22777S" target="_blank" >GA14-22777S: The study of electron-gas interactions in conditions of pressure gradient of low energy environmental scanning electron microscope.</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
18th International Microscopy Congres. Proceedings
ISBN
978-80-260-6720-7
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
Czechoslovak Microscopy Society
Place of publication
Praha
Event location
Praha
Event date
Sep 7, 2014
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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