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Imaging of carbon nanostructures by low energy STEM below 5 keV

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00434115" target="_blank" >RIV/68081731:_____/14:00434115 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Imaging of carbon nanostructures by low energy STEM below 5 keV

  • Original language description

    Our work deals with the imaging of nanostructures composed of light biogenic elements, such as carbon nanotubes, by low energy scanning transmission electron microscopy (STEM). Compared to imaging at the voltages commonly used for TEM and STEM, low energy electrons seem very promising in terms of specimen damage that is caused by a number of elastic andn inelastic collisions. In carbonaceous materials, the most problematic is probably the knock-on damage, where the structure can be impaired by carbon atom displacement. To avoid this problem with structures composed of light elements, a reduction in beam voltage going down to 5 keV has recently been proposed. The range below 5 keV has not been explored yet for this purpose, although electron scatteringin matter is lower for these energies, which allows achieving a higher spatial resolution. We aim to demonstrate that additional reduction of incident electron energy may yield interesting contrast features.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/LO1212" target="_blank" >LO1212: ALISI - Centre of advanced diagnostic methods and technologies</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    18th International Microscopy Congres. Proceedings

  • ISBN

    978-80-260-6720-7

  • ISSN

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

  • Publisher name

    Czechoslovak Microscopy Society

  • Place of publication

    Praha

  • Event location

    Praha

  • Event date

    Sep 7, 2014

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article