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Cryo-SEM of Perpendicular Cross Freeze-Fractures Through a High-Pressure-frozen Biofilm

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00436621" target="_blank" >RIV/68081731:_____/14:00436621 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216305:26210/14:PU110182

  • Result on the web

    <a href="http://dx.doi.org/10.1017/S1431927614007892" target="_blank" >http://dx.doi.org/10.1017/S1431927614007892</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1017/S1431927614007892" target="_blank" >10.1017/S1431927614007892</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Cryo-SEM of Perpendicular Cross Freeze-Fractures Through a High-Pressure-frozen Biofilm

  • Original language description

    The cryo scanning electron microscopy (cryo-SEM) as well as high-pressure-freezing (HPF) belongs to cutting edge techniques in electron microscopy of hydrated samples. However, their combination is not always easily applicable. Here, we present a way ofcombining high-pressure-freezing using EM PACT2 (Leica Microsystems) that fixes hydrated samples on a 1.4 mm sapphire discs and high resolution SEM JEOL 7401F equipped with the cryo-attachment ALTO 2500 (GATAN). The freeze-fracturing technique is used here for investigation of yeast cultures cultivated on the sapphire discs, where we focus on the formation of the extracellular matrix produced during the cultivation.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microscopy and Microanalysis

  • ISSN

    1431-9276

  • e-ISSN

  • Volume of the periodical

    20

  • Issue of the periodical within the volume

    S3

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    2

  • Pages from-to

    1232-1233

  • UT code for WoS article

  • EID of the result in the Scopus database