Very low energy STEM/TOF system

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00460199" target="_blank" >RIV/68081731:_____/16:00460199 - isvavai.cz</a>
Result on the web
<a href="http://www.trends.isibrno.cz/" target="_blank" >http://www.trends.isibrno.cz/</a>
DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Very low energy STEM/TOF system
Original language description
Scanning low energy electron microscopes (SLEEMs) have been built at ISI for over 20 years, either by modification of commercially available SEMs with a cathode lens or completely self-built in case of a dedicated ultra-high vacuum scanning low energy electron microscope (UHV SLEEM). Recently, the range of detection methods has been extendednby a detector for electrons transmitted through ultrathin films and 2D crystals like graphene. For a better understanding of interaction between low energy electrons and solids in general, and the image contrast mechanism in particular, it was considered useful to measure the energy of transmitted electrons. This allows a better comparison with simulations, which suffer from increasing complexity due to a stronger interaction of electrons with the density of states at low energies.
Czech name
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Czech description
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Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
ISBN
978-80-87441-17-6
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
6-7
Publisher name
Institute of Scientific Instruments CAS
Place of publication
Brno
Event location
Skalský dvůr
Event date
May 29, 2016
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000391254000001

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