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Applications of the Scanning Low Energy Electron Microscope

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F12%3A00379913" target="_blank" >RIV/68081731:_____/12:00379913 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1017/S1431927612006836" target="_blank" >http://dx.doi.org/10.1017/S1431927612006836</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1017/S1431927612006836" target="_blank" >10.1017/S1431927612006836</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Applications of the Scanning Low Energy Electron Microscope

  • Original language description

    Recent applications of the Scanning Low Energy Electron Microscope (SLEEM) are presented. The device employs the electron signal reflected from the specimen as well as that transmitted through the specimen for observation throughout the full energy scaledown to units of electronvolts.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microscopy and Microanalysis

  • ISSN

    1431-9276

  • e-ISSN

  • Volume of the periodical

    18

  • Issue of the periodical within the volume

    S2

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    2

  • Pages from-to

    996-997

  • UT code for WoS article

  • EID of the result in the Scopus database