Applications of the Scanning Low Energy Electron Microscope
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F12%3A00379913" target="_blank" >RIV/68081731:_____/12:00379913 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1017/S1431927612006836" target="_blank" >http://dx.doi.org/10.1017/S1431927612006836</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1017/S1431927612006836" target="_blank" >10.1017/S1431927612006836</a>
Alternative languages
Result language
angličtina
Original language name
Applications of the Scanning Low Energy Electron Microscope
Original language description
Recent applications of the Scanning Low Energy Electron Microscope (SLEEM) are presented. The device employs the electron signal reflected from the specimen as well as that transmitted through the specimen for observation throughout the full energy scaledown to units of electronvolts.
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
—
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microscopy and Microanalysis
ISSN
1431-9276
e-ISSN
—
Volume of the periodical
18
Issue of the periodical within the volume
S2
Country of publishing house
US - UNITED STATES
Number of pages
2
Pages from-to
996-997
UT code for WoS article
—
EID of the result in the Scopus database
—