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Low-emittance copper-coating system using atomic-layer-deposited aluminum oxide

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F22%3A00557634" target="_blank" >RIV/68081731:_____/22:00557634 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.sciencedirect.com/science/article/pii/S0040609022000992" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0040609022000992</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.tsf.2022.139179" target="_blank" >10.1016/j.tsf.2022.139179</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Low-emittance copper-coating system using atomic-layer-deposited aluminum oxide

  • Original language description

    Copper, due to its unique properties, has a huge technological importance to our society. However, the oxidation of copper remains an issue in numerous application areas. This is especially the case in visible and IR-band optics, where even minuscule oxide layers degrade the thermo-optical properties of copper surfaces. A solution possibly resides in the application of protective coatings, which can simultaneously impair the low thermal emittance of bare copper surfaces. The present paper examines the use of thin Al2O3 layers as a protective coating for copper. Al2O3 layers with thickness of 4.5, 9.1, 18.5 or 28.3 nm were deposited on polished copper discs using atomic layer deposition (ALD). The total hemispherical emissivity and absorptivity of these coated copper discs were measured from 20 K up to room temperature. The emissivity and absorptivity of the copper with ALD-deposited Al2O3 layers increased with rising temperature and layer thickness. Nonetheless, the observed values stayed below 1.8%, allowing the use of the coated copper in systems where low emission or absorption of thermal radiation is needed. Alongside the experiments, we present a computer-based analysis and interpretation, which may be generally applied for prediction of temperature-dependent emittance of metallic surfaces coated with a thin polar dielectric layer.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20303 - Thermodynamics

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2022

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Thin Solid Films

  • ISSN

    0040-6090

  • e-ISSN

    1879-2731

  • Volume of the periodical

    749

  • Issue of the periodical within the volume

    1 May

  • Country of publishing house

    CH - SWITZERLAND

  • Number of pages

    9

  • Pages from-to

    139179

  • UT code for WoS article

    000791327600003

  • EID of the result in the Scopus database

    2-s2.0-85127030076