3D characterization of material structure using scanning electron microscopy (SEM) and focused ion beam (FIB)
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F10%3A00351718" target="_blank" >RIV/68378271:_____/10:00351718 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
3D characterization of material structure using scanning electron microscopy (SEM) and focused ion beam (FIB)
Original language description
The possibilities of analysis can be enhanced by utilizing focused ion beam (FIB). The FIB instrument allows revealing the structure in the third dimension by controlled and precise milling of the material. In combination with electron beam and suitabledetector is possible to describe crystallography (EBSD) or chemical composition (EDS) etc. in three dimensions (3D). Thus, it is feasible to define real size, shape and distribution of microstructure features such as grains, grain boundaries, phases, precipitates and micropores.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Metal 2010 - 19th international conference on metallurgy and materials
ISBN
978-80-87294-15-4
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
Tanger s.r.o
Place of publication
Ostrava
Event location
Rožnov pod Radhoštěm
Event date
May 18, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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