X-ray topographic investigation of the deformation field around spots irradiated by FLASH single pulses

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F11%3A00372183" target="_blank" >RIV/68378271:_____/11:00372183 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.radphyschem.2011.02.034" target="_blank" >http://dx.doi.org/10.1016/j.radphyschem.2011.02.034</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.radphyschem.2011.02.034" target="_blank" >10.1016/j.radphyschem.2011.02.034</a>

Result language
angličtina
Original language name
X-ray topographic investigation of the deformation field around spots irradiated by FLASH single pulses
Original language description
An important problem in the experiments performed with the intense fourth generation X-ray sources is the damages of the examined samples caused by the high energy impact. The effect introduced by the beam from the FLASH source in crystalline silicon samples was studied through synchrotron white beam projection and section topography, enabling the evaluation of the strain field associated with the damages. The topographs indicated the existence of deformed field of cylindrical symmetry providing the dark contrast. It was also shown that some of the Bragg-case section images of spots in silicon correspond well to the simulated images of rod-like inclusions.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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