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Microscopic characterizations of nanostructured silicon thin films for solar cells

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F11%3A00375054" target="_blank" >RIV/68378271:_____/11:00375054 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1557/opl.2011.1097" target="_blank" >http://dx.doi.org/10.1557/opl.2011.1097</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1557/opl.2011.1097" target="_blank" >10.1557/opl.2011.1097</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Microscopic characterizations of nanostructured silicon thin films for solar cells

  • Original language description

    Microscopic characterization of mixed phase silicon thin films by conductive atomic force microscopy (C-AFM) was used to study the structure composed of conical microcrystalline grains dispersed in amorphous matrix. C-AFM experiments were interpreted using simulations of electric field and current distributions. Density of absorbed optical power was calculated by numerically solving the Maxwell equations. The goal of this study is to combine both models in order to simulate local photoconductivity for understanding the charge photogeneration and collection in nanostructured solar cells.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Amorphous and Polycrystalline Thin-Film Silicon Science and Technology

  • ISBN

    9781605112985

  • ISSN

  • e-ISSN

  • Number of pages

    9

  • Pages from-to

    313-321

  • Publisher name

    MRS

  • Place of publication

    Warrendale

  • Event location

    San Francisko

  • Event date

    Apr 25, 2011

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article