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Microscopic measurements of polycrystalline silicon thin films on glass

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F11%3A00375317" target="_blank" >RIV/68378271:_____/11:00375317 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.4229/26thEUPVSEC2011-3AV.3.14" target="_blank" >http://dx.doi.org/10.4229/26thEUPVSEC2011-3AV.3.14</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.4229/26thEUPVSEC2011-3AV.3.14" target="_blank" >10.4229/26thEUPVSEC2011-3AV.3.14</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Microscopic measurements of polycrystalline silicon thin films on glass

  • Original language description

    Microscopic study of charge transport collection in silicon thin films can be studied with resolution down to 10 nm, which allows study of individual crystalline grains in microcrystalline silicon or individual crystallites separated by grain boundarieswithin the polycrystalline silicon grains on glass. We have developed two complementary approaches: conductive atomic force microscopy (C-AFM) and measurements with two probes navigated by a scanning electron microscope. We have also proposed and testeda novel procedure for measurements of the same spot after repeated mounting. The procedure uses simple nanoindentation marks which can be easily localized with high precision in various microscopes used (optical, scanning electron microscope, CAFM). Thisenables measurements of the same spot on a sample before and after technological steps (e.g. hydrogenation or deposition) and thus an investigation of microscopic effects of these treatments.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 26th European Photovoltaic Solar Energy Conference and Exhibition

  • ISBN

    3-936338-27-2

  • ISSN

  • e-ISSN

  • Number of pages

    3

  • Pages from-to

    2788-2790

  • Publisher name

    WIP München

  • Place of publication

    München

  • Event location

    Hamburg

  • Event date

    Sep 5, 2011

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article