Investigating inhomogeneous electronic properties of radial junction solar cells using correlative microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F15%3A00452915" target="_blank" >RIV/68378271:_____/15:00452915 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.7567/JJAP.54.08KA08" target="_blank" >http://dx.doi.org/10.7567/JJAP.54.08KA08</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.7567/JJAP.54.08KA08" target="_blank" >10.7567/JJAP.54.08KA08</a>

Result language

angličtina

Original language name

Investigating inhomogeneous electronic properties of radial junction solar cells using correlative microscopy

Original language description

Solar cells with radial junctions based on silicon nanowires were investigated using correlative microscopy to determine the nature of previously reported inhomogeneity of their electronic properties. For correlation, we have prepared sets of three Vickers nanoindents arranged in a right triangle with 20 ?m sides as marks of local frame of reference. Due to the shape of the indents (squares with 4 ?m sides and clear diagonals) the position of the marks can be located with high precision by various microscopes. This enabled us to correlate the results from scanning electron microscopy, Kelvin probe force microscopy and conductive atomic force microscopy techniques on the same place of the sample, with a precision down to individual nanowires, obtainingnew information about the electronic inhomogeneity. Using the conductive AFM we analyzed the growth process of silicon nanowires step by step in order to find possible origins of the local (photo)current variations.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2015

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Japanese Journal of Applied Physics

ISSN

0021-4922

e-ISSN

—

Volume of the periodical

54

Issue of the periodical within the volume

8

Country of publishing house

JP - JAPAN

Number of pages

5

Pages from-to

"08KA08-1"-"08KA08-5"

UT code for WoS article

000358662900009

EID of the result in the Scopus database

2-s2.0-84938507740