Conductive atomic force microscopy on carbon nanowalls

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F12%3A00389053" target="_blank" >RIV/68378271:_____/12:00389053 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.jnoncrysol.2011.12.094" target="_blank" >http://dx.doi.org/10.1016/j.jnoncrysol.2011.12.094</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.jnoncrysol.2011.12.094" target="_blank" >10.1016/j.jnoncrysol.2011.12.094</a>

Result language
angličtina
Original language name
Conductive atomic force microscopy on carbon nanowalls
Original language description
The nanostructure of carbon nanowalls (CNWs) was investigated by Torsion Resonance (TR) Atomic Force Microscopy (AFM). In this dynamic non-contact imaging mode a cantilever oscillates torsionally and the amplitude of oscillations is used for the AFM feedback. The technique includes benefits of the semicontact (tapping) mode and at the same time allows one to measure the local conductivity. Moreover, the phase signal is much stronger and fine structures of the CNWs were observed. We also present a comparison of the results obtained by TR, tapping, and contact modes.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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