Is light-induced degradation of a-Si:H/c-Si interfaces reversible?
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F14%3A00432338" target="_blank" >RIV/68378271:_____/14:00432338 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1063/1.4885501" target="_blank" >http://dx.doi.org/10.1063/1.4885501</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.4885501" target="_blank" >10.1063/1.4885501</a>
Alternative languages
Result language
angličtina
Original language name
Is light-induced degradation of a-Si:H/c-Si interfaces reversible?
Original language description
Thin hydrogenated amorphous silicon (a-Si:H) films deposited on crystalline silicon (c-Si) surfaces are sensitive probes for the bulk electronic properties of a-Si:H. Here, we use such samples during repeated low-temperature annealing and visible-light soaking to investigate the long-term stability of a-Si:H films. We observe that during annealing the electronic improvement of the interfaces follows stretched exponentials as long as hydrogen evolution in the films can be detected. Once such evolution isno longer observed, the electronic improvement occurs much faster. Based on these findings, we discuss how the reversibility of light-induced defects depends on (the lack of observable) hydrogen evolution.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Physics Letters
ISSN
0003-6951
e-ISSN
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Volume of the periodical
104
Issue of the periodical within the volume
25
Country of publishing house
US - UNITED STATES
Number of pages
4
Pages from-to
"252108-1"-"252108-4"
UT code for WoS article
000338515900048
EID of the result in the Scopus database
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