Scanning thermal microscopy of thermoelectric nanostructures

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F16%3A00470064" target="_blank" >RIV/68378271:_____/16:00470064 - isvavai.cz</a>
Alternative codes found
RIV/67985882:_____/16:00469517 RIV/61389013:_____/16:00470064
Result on the web
<a href="http://dx.doi.org/10.1007/s11664-015-4193-7" target="_blank" >http://dx.doi.org/10.1007/s11664-015-4193-7</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1007/s11664-015-4193-7" target="_blank" >10.1007/s11664-015-4193-7</a>

Result language
angličtina
Original language name
Scanning thermal microscopy of thermoelectric nanostructures
Original language description
We present the development and results of a new simple method for thermal conductivity characterization of thin films and thermoelectric structures using a scanning thermal microscope in pulsed current mode. The presented method does not allow measurement of absolute thermal conductivity of the studied system, but only relative to the Si substrate. We present the results of the method on the Si substrate/layer step boundary. The nano-layers of different thickness and different materials were prepared for the experiments by the pulsed laser deposition from hot-pressed targets.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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