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Influence of Si doping in different layers on luminescence properties of InGaN/GaN multiple quantum well structure

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F18%3A00502374" target="_blank" >RIV/68378271:_____/18:00502374 - isvavai.cz</a>

  • Result on the web

    <a href="https://kiplwww.fjfi.cvut.cz/drupal7/sites/default/files/Sbornik_SSCSSPM8_2018_FinalPublished_compressed.pdf" target="_blank" >https://kiplwww.fjfi.cvut.cz/drupal7/sites/default/files/Sbornik_SSCSSPM8_2018_FinalPublished_compressed.pdf</a>

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Influence of Si doping in different layers on luminescence properties of InGaN/GaN multiple quantum well structure

  • Original language description

    Luminescence of InGaN/GaN multiple quantum well (MQW) structure is strongly affected by spontaneous and piezoelectric polarizations. To suppress them, doping with shallow impurities (e. g. Si) can be used. This works presents the effects of Si doping in different layers around the MQW area. On the basis of photoluminescence and cathodoluminescence measurements and band structure simulation, the piezoelectric field is most efficiently reduced when both layers under and over MQW area are Si doped.n

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 8th Student scientific conference of solid state engineering and materials

  • ISBN

    978-80-01-06511-2

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    42-45

  • Publisher name

    České vysoké učení technické v Praze

  • Place of publication

    Praha

  • Event location

    Sedliště

  • Event date

    Sep 17, 2018

  • Type of event by nationality

    CST - Celostátní akce

  • UT code for WoS article