Hard X-ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F20%3A00535112" target="_blank" >RIV/68378271:_____/20:00535112 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1002/sia.6829" target="_blank" >https://doi.org/10.1002/sia.6829</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/sia.6829" target="_blank" >10.1002/sia.6829</a>
Alternative languages
Result language
angličtina
Original language name
Hard X-ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces
Original language description
We present a study of buried GaP/Si(001) heterointerfaces by hard X-ray photoelectron spectroscopy. Well-defined thin (4–50 nm) GaP films were grown on Si(001) substrates with 2 miscut orientations by metalorganic vapor phase epitaxy. Core level photoelectron intensities and valence band spectra were measured on heterostructures as well as on the corresponding reference (bulk) substrates. Detailed analysis of core level peaks revealed line broadening and energetic shifts. Valence band offsets were derived for the films with different thickness. Based on the observed variation of the valence band offsets with the GaP film thickness and on the experimental evidence of line broadening, the existence of charge displacement at the GaP/Si(001) interface is suggested.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Surface and Interface Analysis
ISSN
0142-2421
e-ISSN
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Volume of the periodical
52
Issue of the periodical within the volume
12
Country of publishing house
US - UNITED STATES
Number of pages
6
Pages from-to
933-938
UT code for WoS article
000544119700001
EID of the result in the Scopus database
2-s2.0-85087168251