In situ optical and electrical analysis of transient plasmas generated by ns-laser ablation for Ag nanostructured film production

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F21%3A00546676" target="_blank" >RIV/68378271:_____/21:00546676 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1016/j.vacuum.2021.110528" target="_blank" >https://doi.org/10.1016/j.vacuum.2021.110528</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.vacuum.2021.110528" target="_blank" >10.1016/j.vacuum.2021.110528</a>

Result language
angličtina
Original language name
In situ optical and electrical analysis of transient plasmas generated by ns-laser ablation for Ag nanostructured film production
Original language description
The continuous effort for transitioning pulsed laser deposition (PLD) technique from an experimental tool into an industrial one can be sustained by the use of complex tools for in situ real-time monitoring of the deposition process. Langmuir Probe (LP) and optical emission spectroscopy (OES) measurements were used for plasma monitoring during PLD of silver films under various Ar pressure conditions. The LP measurements revealed a multi-structured distribution of the ions, which was strongly influenced by the increase of Ar pressure.
Czech name
—
Czech description
—

Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Similar results(10)