The influence of Si on the properties of MOVPE grown GaN thin films: Optical and EPR study
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F22%3A00561462" target="_blank" >RIV/68378271:_____/22:00561462 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1016/j.radmeas.2022.106842" target="_blank" >https://doi.org/10.1016/j.radmeas.2022.106842</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.radmeas.2022.106842" target="_blank" >10.1016/j.radmeas.2022.106842</a>
Alternative languages
Result language
angličtina
Original language name
The influence of Si on the properties of MOVPE grown GaN thin films: Optical and EPR study
Original language description
Metal Organic Vapour Phase epitaxy (MOVPE) grown GaN layers doped with Si were studied by means of radio-, photo- and thermally stimulated luminescence, scintillation decay kinetics, as well as electron paramagnetic resonance. Two luminescence bands were observed: the narrow and fast peaking at about 3.45 eV (ascribed to excitons) and the broad and slow one having maximum at about 2.2 eV (produced by the defect – a carbon occupying nitrogen site). The decay time and the intensity of exciton and defect-related emission exhibit dependence on the doping level of Si. Both bands are getting faster upon the increased Si content. Interestingly, the effect of Si on the conductivity properties of the GaN samples was observed by means of electron paramagnetic resonance.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
<a href="/en/project/GJ20-05497Y" target="_blank" >GJ20-05497Y: Nanoscintillators based on ultrafast luminescent multiple quantum well structures and composites</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Radiation Measurements
ISSN
1350-4487
e-ISSN
1879-0925
Volume of the periodical
157
Issue of the periodical within the volume
Sep
Country of publishing house
GB - UNITED KINGDOM
Number of pages
9
Pages from-to
106842
UT code for WoS article
000888793800002
EID of the result in the Scopus database
2-s2.0-85135905981