Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F22%3A00568882" target="_blank" >RIV/68378271:_____/22:00568882 - isvavai.cz</a>
Result on the web
<a href="https://hdl.handle.net/11104/0340160" target="_blank" >https://hdl.handle.net/11104/0340160</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.tsf.2022.139580" target="_blank" >10.1016/j.tsf.2022.139580</a>

Result language
angličtina
Original language name
Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry
Original language description
This paper discusses the fundamentals, applications, potential and limitations of polarized light reflection techniques for the characterization of phase-change materials (PCMs). These techniques include spectroscopic ellipsometry, time-resolved ellipsometry and imaging ellipsometry as well as polarimetry. We explore the ca-pabilities of spectroscopic ellipsometry in the determination of the extinction coefficient of PCMs and the ca-pabilities of imaging ellipsometry to characterize PCMs. We show that ellipsometry is capable of more than the determination of thickness and optical properties, and it can be exploited to gain information about crystalli-zation/amorphization kinetics and mapping anisotropies.
Czech name
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Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10303 - Particles and field physics

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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