Coating of self-sensing atomic force microscopy cantilevers with Boron-doped nanocrystalline diamond at low temperatures
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F25%3A00602379" target="_blank" >RIV/68378271:_____/25:00602379 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21230/25:00377492
Result on the web
<a href="https://hdl.handle.net/11104/0359633" target="_blank" >https://hdl.handle.net/11104/0359633</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/pssa.202400553" target="_blank" >10.1002/pssa.202400553</a>
Alternative languages
Result language
angličtina
Original language name
Coating of self-sensing atomic force microscopy cantilevers with Boron-doped nanocrystalline diamond at low temperatures
Original language description
Doped diamond has found a commercial use for achieving durable and reproducible electrical measurements in atomic force microscopy (AFM). Yet so far it has not been used on self-sensing AFM probes due to thermally and mechanically sensitive integrated detection circuits. Herein, conventional microwave plasma chemical vapor deposition (CVD) is employed while taking advantage of thermal conductivity along the silicon AFM cantilever probe for growing high-quality B-doped nanocrystalline diamond film on the probe apex that is selectively seeded by dip coating in nanodiamond solution. By investigating various CVD process parameters, it is shown that the detection circuit remains functional up to 400 °C for 2 h deposition or up to 8 h at 300 °C. Scanning electron microscopy and Raman spectroscopy corroborate quality of the diamond coating and doping. The self-sensing probes are successfully tested in conductive AFM (C-AFM) regime and surface spreading resistance regime, showing linear response in current–voltage spectroscopy and capability of conductivity mapping on metals and semiconductor devices. In the results, prospects for stable C-AFM measurements when conventional optical detection is not suitable, such as on photosensitive materials or in probe-electron microscopy, are opened.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2025
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Physica Status Solidi A
ISSN
1862-6300
e-ISSN
1862-6319
Volume of the periodical
222
Issue of the periodical within the volume
5
Country of publishing house
US - UNITED STATES
Number of pages
7
Pages from-to
2400553
UT code for WoS article
001324079100001
EID of the result in the Scopus database
2-s2.0-86000428410