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Coating of self-sensing atomic force microscopy cantilevers with Boron-doped nanocrystalline diamond at low temperatures

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F25%3A00602379" target="_blank" >RIV/68378271:_____/25:00602379 - isvavai.cz</a>

  • Alternative codes found

    RIV/68407700:21230/25:00377492

  • Result on the web

    <a href="https://hdl.handle.net/11104/0359633" target="_blank" >https://hdl.handle.net/11104/0359633</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1002/pssa.202400553" target="_blank" >10.1002/pssa.202400553</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Coating of self-sensing atomic force microscopy cantilevers with Boron-doped nanocrystalline diamond at low temperatures

  • Original language description

    Doped diamond has found a commercial use for achieving durable and reproducible electrical measurements in atomic force microscopy (AFM). Yet so far it has not been used on self-sensing AFM probes due to thermally and mechanically sensitive integrated detection circuits. Herein, conventional microwave plasma chemical vapor deposition (CVD) is employed while taking advantage of thermal conductivity along the silicon AFM cantilever probe for growing high-quality B-doped nanocrystalline diamond film on the probe apex that is selectively seeded by dip coating in nanodiamond solution. By investigating various CVD process parameters, it is shown that the detection circuit remains functional up to 400 °C for 2 h deposition or up to 8 h at 300 °C. Scanning electron microscopy and Raman spectroscopy corroborate quality of the diamond coating and doping. The self-sensing probes are successfully tested in conductive AFM (C-AFM) regime and surface spreading resistance regime, showing linear response in current–voltage spectroscopy and capability of conductivity mapping on metals and semiconductor devices. In the results, prospects for stable C-AFM measurements when conventional optical detection is not suitable, such as on photosensitive materials or in probe-electron microscopy, are opened.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2025

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Physica Status Solidi A

  • ISSN

    1862-6300

  • e-ISSN

    1862-6319

  • Volume of the periodical

    222

  • Issue of the periodical within the volume

    5

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    7

  • Pages from-to

    2400553

  • UT code for WoS article

    001324079100001

  • EID of the result in the Scopus database

    2-s2.0-86000428410