Influence of Object Position on Accuracy of Optical Measurement Systems

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21110%2F05%3A00109597" target="_blank" >RIV/68407700:21110/05:00109597 - isvavai.cz</a>

Result on the web

—

DOI - Digital Object Identifier

—

Result language

angličtina

Original language name

Influence of Object Position on Accuracy of Optical Measurement Systems

Original language description

The work analyses an influence of the change of object position on the accuracy of optical and optoelectronic measurement systems using both geometrical and diffraction theory. It is shown that in case of the change of position of the measured object theimaging properties of the used optical measurement instrument are changed

Czech name

—

Czech description

—

Type

D - Article in proceedings

CEP classification

BH - Optics, masers and lasers

OECD FORD branch

—

Project

<a href="/en/project/GA103%2F02%2F0357" target="_blank" >GA103/02/0357: Modern optoelectronic methods of measuring surfaces´topography</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2005

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Proceedings of SPIE Vol. 5945

ISBN

0-8194-5951-8

ISSN

0277-786X

e-ISSN

—

Number of pages

11

Pages from-to

—

Publisher name

SPIE

Place of publication

Washington

Event location

Nitra

Event date

Sep 13, 2004

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

—