Testing of High Resolution ADCs with Deterministic and Stochastic Signals

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F03%3A03087732" target="_blank" >RIV/68407700:21230/03:03087732 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Testing of High Resolution ADCs with Deterministic and Stochastic Signals

Original language description

High-linearity and high-resolution AD converters that are difficult to test by standard methods using deterministic signal can be tested by means of stochastic test methods. Histogram test can use various input signals and allows use noise as the input signal. To overcome difficulties related to generation of large-scale uniformly distributed stochastic signal, a method based on superposition of Gaussian noises with equidistantly spaced DC shifts has been proposed and theoretical analysis has been provided there. In current development stage, it can host the following 16-bits ADCs with SAR transfer technology.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2003

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

ETW 2003

ISBN

0-7695-1908-3

ISSN

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e-ISSN

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Number of pages

2

Pages from-to

19-20

Publisher name

IEEE Computer Society TTTC

Place of publication

Maastricht

Event location

Maastricht

Event date

May 25, 2003

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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