Application of Noise Signal for Testing High Resolution ADCs

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F03%3A03088460" target="_blank" >RIV/68407700:21230/03:03088460 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Application of Noise Signal for Testing High Resolution ADCs

Original language description

High-linearity and high-resolution AD converters that are difficult to test by standard methods using deterministic signal [1] can be tested by means of stochastic test methods Histogram test can use various input signals and principally allows use noiseas the input signal. To overcome difficulties related to generation of large-scale uniformly distributed stochastic signal, a method based on superposition of Gaussian noises with equidistantly spaced DC shifts has been proposed and theoretical analysishas been provided there [2]. In current development stage, it can host the following 16-bits ADCs with SAR transfer technology.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2003

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Electronic Devices and Systems 03 - Proceedings

ISBN

80-214-2452-4

ISSN

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e-ISSN

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Number of pages

6

Pages from-to

152-157

Publisher name

VUT FEI, Ústav mikroelektroniky

Place of publication

Brno

Event location

Brno

Event date

Sep 9, 2003

Type of event by nationality

EUR - Evropská akce

UT code for WoS article

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