Dynamic Testing of 16 bit ADC with Sinewave and Stochastic Signals

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F03%3A03088461" target="_blank" >RIV/68407700:21230/03:03088461 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Dynamic Testing of 16 bit ADC with Sinewave and Stochastic Signals

Original language description

High-linearity and high-resolution AD converters that are difficult to test by standard methods using deterministic signal can be tested by means of stochastic test methods Histogram test can use various input signals and principally allows use noise asthe input signal. To overcome difficulties related to generation of large-scale uniformly distributed stochastic signal, a method based on superposition of Gaussian noises with equidistantly spaced DC shifts has been proposed and theoretical analysis hasbeen provided there.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2003

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Applied Electronics

ISBN

80-7082-951-6

ISSN

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e-ISSN

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Number of pages

4

Pages from-to

87-90

Publisher name

ZČU Plzeň

Place of publication

Plzeň

Event location

Plzeň

Event date

Sep 10, 2003

Type of event by nationality

EUR - Evropská akce

UT code for WoS article

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