Stochastic Test Method Application for 16-Bit Reference ADC Device

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F03%3A03088357" target="_blank" >RIV/68407700:21230/03:03088357 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Stochastic Test Method Application for 16-Bit Reference ADC Device
Original language description
Stochastic methods for ADC (analogue-to-digital converter) tests have been developed to enable testing of precise AD converters that are difficult to test by standard methods using deterministic signal. A transportable high stable reference AD device wasdesigned and realised for a comparison of systems for testing a dynamic quality of ADCs or AD modules using mainly those standard (deterministic) test methods. However, the stochastic test methods require different conditions and test arrangement due tolarge number of samples that has to be acquired during the stochastic test. This article shows results of the test and their comparison with standard tests performed on the same ADC.
Czech name
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Czech description
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Project
<a href="/en/project/GP102%2F01%2FD087" target="_blank" >GP102/01/D087: New Methods of Digitizers Testing by means of Stochastic Signals</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Measurement 2003 - Proceedings of the 4th International Conference on Measurement
ISBN
80-967402-6-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
95-98
Publisher name
Slovak Academy of Sciences, Institute of Measurement Science
Place of publication
Bratislava
Event location
Smolenice
Event date
Jun 15, 2003
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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