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Step-Gauss Stochastic Testing Method Application for Transportable Reference ADC Device

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F03%3A03088459" target="_blank" >RIV/68407700:21230/03:03088459 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Step-Gauss Stochastic Testing Method Application for Transportable Reference ADC Device

  • Original language description

    The Step-Gauss stochastic test method has been developed to enable testing of precise AD converters that are difficult to test by standard methods using deterministic signal. A transportable high stable reference AD device was designed and realised for acomparison of systems for testing a dynamic quality of ADCs or AD modules using mainly those standard (deterministic) test methods. However, the stochastic test methods require different conditions and test arrangement due to large number of samples that has to ne acquired during the stochastic test. This article describes how the stochastic test has been designed, arranged and performed considering its specific features.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GP102%2F01%2FD087" target="_blank" >GP102/01/D087: New Methods of Digitizers Testing by means of Stochastic Signals</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2003

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    IWADC 2003

  • ISBN

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    223-226

  • Publisher name

    IEEE

  • Place of publication

    Perugia

  • Event location

    Perugia

  • Event date

    Sep 8, 2003

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article