Reliable CAD Analyses of CMOS Radio Frequency and Microwave Circuits Using Smoothed Gate Capacitance Models
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F03%3A03088616" target="_blank" >RIV/68407700:21230/03:03088616 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Reliable CAD Analyses of CMOS Radio Frequency and Microwave Circuits Using Smoothed Gate Capacitance Models
Original language description
The problems with convergence caused by both voltage- and charge-controlled models of MOSFET gate capacitances are often a limiting factor of the computer aided design tools. In the paper, an idea of the exponential smoothing of model discontinuities isproposed. The method is demonstrated on smoothing the gate capacitance discontinuity at zero drain-source voltage. An advanced integration algorithm convenient for the computer aided design of radio frequency and microwave CMOS circuits suppressing possible physically incorrect results of the traditional methods is also described. The updated model and algorithm are checked by analyzing a sophisticated CMOS flip-flop circuit.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F01%2F0432" target="_blank" >GA102/01/0432: Symbolic, semisymbolic and numerical methods of analysis, design and optimization of electrical circuits</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
AEU-International Journal of Electronics and Communications
ISSN
1434-8411
e-ISSN
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Volume of the periodical
57
Issue of the periodical within the volume
6
Country of publishing house
DE - GERMANY
Number of pages
9
Pages from-to
372-380
UT code for WoS article
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EID of the result in the Scopus database
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