Nonlinearity of Thick Film Resistors in Comparison with Zigalski Theory
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F03%3A03090572" target="_blank" >RIV/68407700:21230/03:03090572 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21340/03:03090572 RIV/68407700:21230/03:00087637
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Nonlinearity of Thick Film Resistors in Comparison with Zigalski Theory
Original language description
The paper is focused on study of dependence of nonlinearity of C-V characteristic of thick film resistors. The relationship between nonlinearity an topology of resistors was found with using approximation of measured dependences.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
26th International Spring Seminar on Electronics Technology
ISBN
0-7803-8002-9
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
41-45
Publisher name
Technical University of Košice
Place of publication
Košice
Event location
High Tatras, Slovakia
Event date
May 8, 2003
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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