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Assembly Influence on the Small-Signal Parameters of a Packaged Transistor

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F05%3A03112237" target="_blank" >RIV/68407700:21230/05:03112237 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Assembly Influence on the Small-Signal Parameters of a Packaged Transistor

  • Original language description

    A detailed analysis of the assembly influence on the small-signal parameters of a packaged transistor is presented. A new method, based on 3D field simulation and mixed-mode scattering parameters approach is proposed. Differences in scattering parameterscaused by assembly change are computed using the new proposed method and compared to the standard method based on admittance matrix. The differences, accuracy, error sources and suitability of both methods are discussed. Results are verified experimentally in microstrip line for two fundamental assembly change of a transistor in SOT 343 package in frequency range 45 MHz - 18 GHz.

  • Czech name

    Vliv montáže na malosignálové parametry pouzdřeného tranzistoru

  • Czech description

    V článku je presentována detailní analýza vlivu montáže na malosignálové parametry pouzdřeného tranzistoru. Rozdíly S-parametrů způsobené změnou motáže jsou získávány novou originální metodou z 3D simulace elektromagnetického pole a jsou verifikovány experimentálně v kmitočtovém pásmu 45 MHz - 18 GHz. Na závěr je uvedena diskuse přesnosti modelování, zdrojů chyb a porovnání nové metody analýzy se standardní.

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2005

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Radioengineering

  • ISSN

    1210-2512

  • e-ISSN

  • Volume of the periodical

    14

  • Issue of the periodical within the volume

    4

  • Country of publishing house

    CZ - CZECH REPUBLIC

  • Number of pages

    6

  • Pages from-to

    75-80

  • UT code for WoS article

  • EID of the result in the Scopus database