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Fault Tolerant System Design Method Based on Self-Checking Circuits

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F06%3A03120136" target="_blank" >RIV/68407700:21230/06:03120136 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Fault Tolerant System Design Method Based on Self-Checking Circuits

  • Original language description

    This paper describes a highly reliable digital circuit design method based on totally self checking blocks implemented in FPGAs. The bases of the self checking blocks are parity predictors. The parity predictor design method based on multiple parity groups is proposed. Proper parity groups are chosen in order to obtain minimal area overhead and to decrease the number of undetectable faults.

  • Czech name

    Fault Tolerant System Design Method Based on Self-Checking Circuits

  • Czech description

    This paper describes a highly reliable digital circuit design method based on totally self checking blocks implemented in FPGAs. The bases of the self checking blocks are parity predictors. The parity predictor design method based on multiple parity groups is proposed. Proper parity groups are chosen in order to obtain minimal area overhead and to decrease the number of undetectable faults.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JC - Computer hardware and software

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA102%2F04%2F0737" target="_blank" >GA102/04/0737: Modern methods of digital system synthesis</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2006

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings IOLTS 2006 12th IEEE International On-Line Testing Symposium

  • ISBN

    0-7695-2620-9

  • ISSN

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    185-186

  • Publisher name

    IEEE Computer Society

  • Place of publication

    Los Alamitos

  • Event location

    Como

  • Event date

    Jul 10, 2006

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article