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Improved Evaluation of Planar Calibration Standards Using TDR Preselection Method

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F06%3A03125272" target="_blank" >RIV/68407700:21230/06:03125272 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Improved Evaluation of Planar Calibration Standards Using TDR Preselection Method

  • Original language description

    Calibration and correction methods for Vector Network Analyzer (VNA) are based on the fundamental assumption of constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumptionis not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error etching technology on soft substrates. An evaluation of the error model is affected expecially with a variation of themanufacturing process and also with a reproducibillity of an assembly. In this paper, we propose error minimazation using selection of the best combination of available calibration standards based on time-domain reflection (TDR) measuerment. The proposedmethod was verified experimentally using short, open, load and thru (SOLT) standards fabricated on FR4 laminate substrate getting essential reduction of the measurement error in frequency range up to 15 GHz.

  • Czech name

    Vylepšené hodnocení planárních kalibračních standardů pomocí TDR předvýběrové metody

  • Czech description

    Calibration and correction methods for Vector Network Analyzer (VNA) are based on the fundamental assumption of constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumptionis not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error etching technology on soft substrates. An evaluation of the error model is affected expecially with a variation of themanufacturing process and also with a reproducibillity of an assembly. In this paper, we propose error minimazation using selection of the best combination of available calibration standards based on time-domain reflection (TDR) measuerment. The proposedmethod was verified experimentally using short, open, load and thru (SOLT) standards fabricated on FR4 laminate substrate getting essential reduction of the measurement error in frequency range up to 15 GHz.

Classification

  • Type

    A - Audiovisual production

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2006

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • ISBN

  • Place of publication

    Piscataway

  • Publisher/client name

  • Version

  • Carrier ID

    6050 140 R H 36706