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Spectroscopic and photoluminescence study of epoxy novalak resin polymer doped with Er3+, Tm3+ and Er3+/Yb3+ ions

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F08%3A00144830" target="_blank" >RIV/68407700:21230/08:00144830 - isvavai.cz</a>

  • Result on the web

    <a href="http://www.pst.org.tw/macro2008/" target="_blank" >http://www.pst.org.tw/macro2008/</a>

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Spectroscopic and photoluminescence study of epoxy novalak resin polymer doped with Er3+, Tm3+ and Er3+/Yb3+ ions

  • Original language description

    In this paper we report on the optical properties of epoxy novalak resin (ENR) doped with Er3+, Tm3+ ions and co-doped with Er3+/Yb3+ ions. Infrared spectroscopy was used for investigation of O-H vibrations and we observed absorption band about 3390 cm-1corresponds to these vibrations. The absorbance measurement shoved five strong bands at 441 nm (4F3/2), 448 nm (4F5/5), 488 nm (4F7/2), 517 nm (2H11/2) and 539 nm (4S3/2) for the sample containing 10.0 at.% Er3+, while the typical absorption band occurred at 976 nm (2F5/2) for the sample containing 10.0 at.% Yb3+. The samples containing 20.0 at. % of Tm3+ ions had four absorption bands at 464 nm (1G4), 658 nm (3F2), 686 nm (3F3) and 1212 nm (3H5). Semiconductor laser excitation (?ex= 980 nm) was used for photoluminescence measurement and the samples had typical 1530 nm emission due to 4I13/2 ... 4I15/2 Er3+ transition.

  • Czech name

  • Czech description

Classification

  • Type

    O - Miscellaneous

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA102%2F06%2F0424" target="_blank" >GA102/06/0424: New components of the integrated optics made by the planar hybrid technology</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů