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Experimental SEU Impact on Digital Design Implemented in FPGAs

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F08%3A00147000" target="_blank" >RIV/68407700:21230/08:00147000 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Experimental SEU Impact on Digital Design Implemented in FPGAs

  • Original language description

    The main aim of our research is to investigate the influence of SEU on a digital circuit implemented in FPGA. The FPGA resources occupied by design are divided into several groups. SEU impact is investigated for each group. To make a real dependability model the real effects of injected errors and faults have to be studied. The SEU emulator deals with single-bit change in bitstream. Emulation is performed in the user-selected area. Look-Up-Tables, cell interconnections, cell-to-bus connections and routing resources are considered. Other FPGA resources are not considered. Combinatorial circuits and MCNC benchmarks were measured due to our knowledge of FPGA resource limitation. All tests were performed on Atmel FPSLIC architecture.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JC - Computer hardware and software

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/FI-IM4%2F149" target="_blank" >FI-IM4/149: *Research and Development of High-rate Microwave Line Featured by QAM Modulation and the Transmission Speed of 155 Mbit/s.</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of 11th Euromicro Conference on Digital System Design

  • ISBN

    978-0-7695-3277-6

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    IEEE Computer Society

  • Place of publication

    Los Alamitos

  • Event location

    Parma

  • Event date

    Sep 3, 2008

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000264279400014