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Combined Accelerated Climatic Tests Of Electrically Conductive Adhesive

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F10%3A00169421" target="_blank" >RIV/68407700:21230/10:00169421 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Combined Accelerated Climatic Tests Of Electrically Conductive Adhesive

  • Original language description

    Electrically Conductive Adhesives has already been used in the electronics industry for 30 years. In recent years, electrically conductive adhesive plays more and more important roles in industry, especially for its advantages of low curing temperature and environmental. Their applications vary, but mostly include various heat-sensitive devices or devices with fine lead pitch, such as LCD and LED screens. With increased use of ECAs these devices are being used even in harsh environment, such as laptop computers or various displays used in the automotive industry. Accelerated reliability tests have been focused on aspects of the assembly process on a test PCB using one-component and two-component ECAs and their reliability parameters during combined climatic test. The experimental results show that the properties such as electrical resistance as well as the shear strength of electrically conductive adhesive were evidently affected by the temperature and the time during dry heat test.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2010

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Electronic Devices and Systems, IMAPS CS International Conference 2010 Proceedings

  • ISBN

    978-80-214-4138-5

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    VUT v Brně, FEI

  • Place of publication

    Brno

  • Event location

    Brno

  • Event date

    Sep 1, 2010

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article