The Influence of Envirnment on Properties of Thick Film Components
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F10%3A00171379" target="_blank" >RIV/68407700:21230/10:00171379 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
The Influence of Envirnment on Properties of Thick Film Components
Original language description
The work is focused on investigation of behavior of thick film resistors. The changes of parameters of thick film samples exposed to accelerated ageing were analyzed. The samples were exposed in three types of environment during relatively long time. Thesamples with different sizes of thick film resistors were prepared. Conductive and resistive structures were deposited on corundum substrates by screen printing. The silver polymer paste for conductive layer and the carbon black polymer paste for resistive layer were used. The resistance and non linearity of current-voltage characteristic were measured. Non linearity was measured as distortion of sinusoidal AC powering signal.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
EDS 2010 Electronic Devices and Systems
ISBN
978-80-214-4138-5
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
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Publisher name
VUT v Brně, FEI, Ústav mikroelektroniky
Place of publication
Brno
Event location
Brno
Event date
Sep 1, 2010
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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