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History of Research of Tin Whiskers

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F11%3A00185539" target="_blank" >RIV/68407700:21230/11:00185539 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    History of Research of Tin Whiskers

  • Original language description

    Tin whisker is electrically conductive, crystalline structures of tin that grow from surface made of tin. The reason of the growth is still not exactly defined. The presence of tin whisker in the electrical circuit can cause short of the circuit. First tin whisker was firstly observed in 1946 as a reason of error of military equipment. Subsequently deep research in this problematic has started. Whole history of research and development of published theories of the presence and the growth of tin whiskerfrom the start until nowaday is presented here.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    POSTER 2011 - 15th International Student Conference on Electrical Engineering

  • ISBN

    978-80-01-04806-1

  • ISSN

  • e-ISSN

  • Number of pages

    3

  • Pages from-to

    1-3

  • Publisher name

    ČVUT, Fakulta elektrotechnická

  • Place of publication

    Praha

  • Event location

    Prague

  • Event date

    May 12, 2011

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article