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Model based FMEA - An efficient tool for quality management of the free lead soldering

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F12%3A00194646" target="_blank" >RIV/68407700:21230/12:00194646 - isvavai.cz</a>

  • Result on the web

    <a href="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6273078&contentType=Conference+Publications&refinements%3D4291993082%26sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6273073%29" target="_blank" >http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6273078&contentType=Conference+Publications&refinements%3D4291993082%26sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6273073%29</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2012.6273078" target="_blank" >10.1109/ISSE.2012.6273078</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Model based FMEA - An efficient tool for quality management of the free lead soldering

  • Original language description

    The main idea behind of this paper is aimed to improve FMEA (Failure Mode and Effects Analysis) method in the field of the free lead soldering process with employing a Model Based approach (more precisely an Ontological Based Model approach). This approach, a novelty of the Authors, contributes to more efficient risk management of a manufacturing process. It also increases quality, reliability and testing-capability of the process. Further, the Authors describe selected software tools and ontology editors suitable for the support of the introduced method. Finally, a brief description of Model Based FMEA method is set and some future directions of further research are indicated.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    35th International Spring Seminar on Electronics Technology

  • ISBN

    978-1-4673-2241-6

  • ISSN

  • e-ISSN

  • Number of pages

    7

  • Pages from-to

    230-236

  • Publisher name

    Technische Universität

  • Place of publication

    Wien

  • Event location

    Bad Aussee

  • Event date

    May 9, 2012

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article