Quality management from the perspective of model based Project Management framework
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F12%3A00194648" target="_blank" >RIV/68407700:21230/12:00194648 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6273079&contentType=Conference+Publications&refinements%3D4291993082%26sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6273073%29" target="_blank" >http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6273079&contentType=Conference+Publications&refinements%3D4291993082%26sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6273073%29</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/ISSE.2012.6273079" target="_blank" >10.1109/ISSE.2012.6273079</a>
Alternative languages
Result language
angličtina
Original language name
Quality management from the perspective of model based Project Management framework
Original language description
The main idea behind of this paper is aimed to improve PM (Project Management) in the field of product design, concretely in the branch of packaging with employing a Model Based (in other words Model Driven) approach. We propose a modern and innovative project management framework covering entire life cycle of manufacturing project. This original approach, a novelty of the Authors, contributes to more efficient project management of manufacturing process. It also increases quality, reliability and testing-capability of particular project process. Further, the Authors describe selected software and methodical tools suitable for the support of the process. Finally, a brief description of Model Based Project Management Framework (MBPMF) is set and some future directions of further research are indicated
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
35th International Spring Seminar on Electronics Technology
ISBN
978-1-4673-2241-6
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
237-241
Publisher name
Technische Universität
Place of publication
Wien
Event location
Bad Aussee
Event date
May 9, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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