Design methodologies for reliability of SSL LED boards

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F13%3A00205480" target="_blank" >RIV/68407700:21230/13:00205480 - isvavai.cz</a>

Result on the web

<a href="http://www.sciencedirect.com/science/article/pii/S0026271413000930" target="_blank" >http://www.sciencedirect.com/science/article/pii/S0026271413000930</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.microrel.2013.02.017" target="_blank" >10.1016/j.microrel.2013.02.017</a>

Result language

angličtina

Original language name

Design methodologies for reliability of SSL LED boards

Original language description

This work presents a comparison of various LED board technologies from thermal, mechanical and reliability point of view provided by an accurate 3-D modelling. LED boards are proposed as a possible technology replacement of FR4 LED boards used in 400 lumen retrofit SSL lamps. Presented design methodology can be used for other high power SSL lamp designs. The performance of new LED board designs were evaluated by numerical modeling. Modeling methodology was proven by measurement on reference FR4 LED board. Thermal performance was compared by extracting of LED boards thermal resistances and thermal stress has been inspected considering the widest temperature operating range according to standards (-40 to +125 °C). Thermo-mechanical and reliability analysis have been performed to study parameters of each LED board technology, using thermal boundary conditions extracted from the thermal simulation of a whole LED lamp. Elastic-plastic analysis with temperature dependent stress-strain materi

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/7H10017" target="_blank" >7H10017: Consumerizing Solid State Lighting</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year

2013

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Microelectronics Reliability

ISSN

0026-2714

e-ISSN

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Volume of the periodical

53

Issue of the periodical within the volume

8

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

8

Pages from-to

1076-1083

UT code for WoS article

000322292100005

EID of the result in the Scopus database

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